Semiconductor Test Equipment
Agilent introduces its 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE), which includes advanced switching matrix technology and a new atto current sense and switch unit (ASU) that enables automation of parametric instruments without compromising measurement performance. The series is offered racked and cabled, in both probe-card-based and positioner-based models. The probe-card-based versions use Agilent's direct docking and low-leakage probe card technology, which provide a complete IV and CV measurement environment on a wafer prober for up to 48 pins with 1 fA measurement resolution. The positioner-based solutions use the company's ASU technology to enable current measurement with 0.1 fA resolution, as well as allow automated switching between IV and CV measurement.
Agilent Technologies Inc.
Agilent Technologies Inc.
Test and Measurement Group
5301 Stevens Creek Blvd.
Santa Clara, CA, 95051
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